Refine your search:     
Report No.
 - 
Search Results: Records 1-8 displayed on this page of 8
  • 1

Presentation/Publication Type

Initialising ...

Refine

Journal/Book Title

Initialising ...

Meeting title

Initialising ...

First Author

Initialising ...

Keyword

Initialising ...

Language

Initialising ...

Publication Year

Initialising ...

Held year of conference

Initialising ...

Save select records

Journal Articles

Relationship between catalytic property and NEXAFS of P-doped graphite

Shimoyama, Iwao; Hakoda, Teruyuki; Baba, Yuji; Sekiguchi, Tetsuhiro; Hirao, Norie; Koswattage, K.

Photon Factory Activity Report 2011, Part B, p.93_1 - 93_2, 2012/00

no abstracts in English

Journal Articles

Structure determination of self-assembled monolayer on oxide surface by soft-X-ray standing wave

Baba, Yuji; Narita, Ayumi; Sekiguchi, Tetsuhiro; Shimoyama, Iwao; Hirao, Norie; Entani, Shiro; Sakai, Seiji

Photon Factory Activity Report 2011, Part B, P. 201, 2012/00

no abstracts in English

Journal Articles

Orientation of one-dimensional silicon polymer films studied by polarization-dependent NEXAFS

Mannan, M. A.*; Baba, Yuji; Sekiguchi, Tetsuhiro; Shimoyama, Iwao; Hirao, Norie; Nagano, Masamitsu*; Noguchi, Hideyuki*

Photon Factory Activity Report 2011, Part B, P. 159, 2012/00

no abstracts in English

Journal Articles

Swift heavy ion irradiation effect on structural properties for epitaxial Ba(Fe$$_{0.5}$$Mn$$_{0.5}$$)O$$_{3-delta}$$ thin film

Matsui, Toshiyuki*; Iwase, Akihiro*; Yamamoto, Hiroyuki; Hirao, Norie; Baba, Yuji

Photon Factory Activity Report 2011, Part B, P. 243, 2012/00

no abstracts in English

Journal Articles

Development of a wideband multilayer grating with a new layer structure for a flat-field spectrometer attached to transmission electron microscopes in the 2-4 keV range, 2

Imazono, Takashi; Kuramoto, Satoshi*; Koike, Masato

Photon Factory Activity Report 2011, Part B, P. 416, 2012/00

A soft X-ray spectrograph to attach to transmission electron microscopes has been developed. Original TEM-SXES instruments can detect soft X-ray emission (SXE) spectra of the 60-2000 eV range. However it is necessary to develop a new SXES instrument that covers a wider energy range from 2 keV to 4 keV. Observation of the SXE spectra in this energy range needs a multilayer grating because in which a typical grating with a gold coating is no longer practical. A conventional multilayer grating has high diffraction efficiency but narrow band at a fixed angle of incidence. It indicates that the SXES instrument should employ a mechanism for wavelength scanning to cover the required energy range and is unsuitable for the spectrograph to attach to a TEM. To overcome this problem, a new multilayer structure was invented, which uniformly enhances the reflectivity in a few keV energy range at a fixed angle of incidence. The multilayer was deposited on a laminar varied-line-spacing replica grating. The diffraction efficiency of the multilayer grating was evaluated by a goniometric apparatus, soft X-ray diffractometer, at a double-crystal Si monochromator BL-11B at Photon Factory, KEK. It varies from 0.6% to 2.7% over the whole energy range. This means the wide-band multilayer replica grating was developed successfully.

Journal Articles

Analysis of bonding structure of ultrathin films of oligothiophene molecules grown on passivated silicon surfaces

Toyoshima, Hiroaki*; Hiraga, Kenta*; Ono, Shinya*; Tanaka, Masatoshi*; Ozawa, Kenichi*; Mase, Kazuhiko*; Hirao, Norie; Sekiguchi, Tetsuhiro; Shimoyama, Iwao; Baba, Yuji

Photon Factory Activity Report 2011, Part B, P. 102, 2012/00

The knowledge of the interaction between organic molecules and semiconductor surfaces plays an important role in adapting organic semiconductors into the semiconductor technology. In the present study, the process of $$alpha$$-sexithiophene ($$alpha$$-6T) thin layer formation on passivated silicon (Si) surfaces has been investigated in-situ by means of PES, angle-depended NEXAFS (near-edge X-ray absorption fine-structure), SDRS, and RDS. For water-adsorbed Si(001), it was found that the majority of $$alpha$$-6T molecules are standing on the substrate. Above 3 nm, most of molecules are standing and constitute well ordered islands or films. For ethylene adsorbed Si(001) on the contrary, some of $$alpha$$-6T molecules are flat-lying, resulting in less prominent orientation. Thus, the orientation of molecules depends on the method of passivation, which opens the possibility of controlling the molecular orientation by the surface modification.

Journal Articles

Molecular orientation of regioregular poly(3-hexylthiophene) film

Ikeura, Hiromi*; Sekiguchi, Tetsuhiro

Photon Factory Activity Report 2011, Part B, P. 96, 2012/00

The regioregularity (2head-to-5'tail regularity) for organic semiconductor polymer backbone plays a dominant role in controlling molecular orientation, thus strongly influences the performance of organic solar cells. In the present work, we have investigated the orientation structure of donor regioregular poly(3-hexylthiophene) (P3HT) films using angle-resolved near-edge X-ray absorption fine-structure (NEXAFS) spectroscopy. The films on silicon substrates were prepared by solution spin cast method. The lowest unoccupied molecular orbital (LUMO) levels were obtained from the edge energies of S 1s inner-shell excitation, from which energy conversion efficiencies for solar cells were estimated. The results of them were compared with those which were measured for amorphous P3HT films.

Journal Articles

Immobilization of alkyl chain molecules with phosphonic acid on oxide surface

Narita, Ayumi; Baba, Yuji; Sekiguchi, Tetsuhiro; Shimoyama, Iwao; Hirao, Norie; Yaita, Tsuyoshi

Photon Factory Activity Report 2011, Part B, P. 94, 2012/00

Immobilization of organic molecules on oxide surface has been investigated using phosphonic acid as an anchor. The molecule investigated was decyl-phosphonic acid (DPA). The DPA film was formed by immersing the sapphire substrate in DPA ethanol solution. The results for X-ray photoelectron spectra (XPS) showed that the alkyl chain of the DPA molecules is located at the upper side, while the phosphonic acid is the lower side on the surface. The XPS and near-edge X-ray absorption fine structure (NEXAFS) results indicated that the DPA film became homogeneous monolayer by heating at 250$$^{circ}$$C. It is concluded that the phosphonic acid is an excellent anchor that immobilizes the organic molecules on an oxide surface.

8 (Records 1-8 displayed on this page)
  • 1